Test generation and three-state elements, buses, and bidirectionals
نویسندگان
چکیده
Published work on stuck-at fault test generation nearly exclusively considers circuits composed of only binary logic gates. Industrial designs commonly contain three-state elements , such as: busses and drivers, transmission gates, and bidirectional I/O. This paper presents extensions to state-of-the-art ATPG algorithms in order to handle these elements. A 25-valued signal model is used for test generation. Results demonstrate the effectiveness of the proposed extensions in the presence of various three-state elements, and show but a small performance degradation compared to the traditional 9-valued signal model for binary logic circuits.
منابع مشابه
Compact test sets for industrial circuits
Industrial circuits contain, in addition to the binary logic elements n]and, n]or and n]xor gates, other logic elements such as three-state elements, busses and bidirectionals. Previous published work on automatic test pattern generation (ATPG) can not handle all of the above mentioned circuit elements, generates too large test sets, or generates test patterns which can cause circuit damage. A ...
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